Scan testing has been the foundation of digital-device production test for many years. Several innovations have been developed to keep up with the growth in pattern-set sizes brought about by large ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...

The semiconductor industry has long relied on scan ATPG (automatic test pattern generation) tools instead of functional test to create stimulus-response patterns with very high fault coverage. But ...

WILSONVILLE, Ore., May 18, 2015 -- Mentor Graphics Corp. (NASDAQ: MENT) today announced that Mellanox Technologies has standardized on the new Mentor® Tessent® Hierarchical ATPG solution to manage the ...

MOUNTAIN VIEW, Calif. -- Oct. 5, 2015 -- Synopsys, Inc. (Nasdaq: SNPS) today announced a new, breakthrough ATPG and diagnostics technology that delivers 10X faster run time and 25 percent fewer test ...

For testing complex chip designs it makes sense to combine the two most common test methodologies -logic built-in self-test (LBIST) and automatic test pattern generation (ATPG), writes Amer ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Recent and continuing trends in the semiconductor industry pose challenges to IC test-data volumes, test application times, and test costs. The industry has thus far succeeded in containing test costs ...

The ability to create and choose the most effective test patterns has become more daunting as more patterns are introduced, says Ron Press of Siemens Digital Industries. Choosing the most efficient ...