Defects in transistors, such as unwanted impurities and broken chemical bonds in the various layers of the semiconductor, can limit their performance and reliability. These defects are becoming harder ...

Scientists report the development of a method that determines the density of defects in two-dimensional nanomaterials due to measurements of spatial coherence of light that strike them. A UPM ...

Not all defects are visible with the same microscope. Explore how resolution, contrast, and signal interpretation shape ...

Semiconductors based on gallium-nitride (GaN) substrates are increasingly important in the power-device landscape. Their thermal conductivity, and thus their ability to conduct and dissipate heat, is ...

As device sizes continue to increase on devices at 2x nm design rule and beyond and high wafer stress is worsening due to multi-film stacking in the vertical memory process, we observe an increasing ...

Whether you’re using a leading-edge process node to manufacture a very large system-on-chip (SoC), or using an established node for automotive or Internet of Things (IoT) electronics, critical area ...

Originating as a theoretical prediction in the 1940s, with experimental isolation from graphite in 2004, graphene has quickly become a desirable quantum material used in various application areas, ...

Chemical mechanical planarization (CMP) is required during semiconductor processing of many memory and logic devices. CMP is used to create planar surfaces and achieve uniform layer thickness during ...