Reliability Patterns That Sustain Robotics and Industrial Automation

Reliability is expected when systems are new. The real test comes after deployment and years of continuous operation.
Semiconductor Engineering

Using Automated Pattern Matching For SRAM Physical Verification

How often have you struggled to verify static random-access memory (SRAM) blocks in your design? And how often, no matter how much time you spend on them, do they end up causing manufacturing issues?
Electronic Design

Simulation Mismatches Can Foul Up Test-Pattern Verification

Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...
Electronic Design

Using Timing Constraints For Generating At-Speed Test Patterns

Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...