Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. In this episode, Thomas Betts chats with ...
Leverage Functional Interfaces For High-Speed Test Access During All Phases Of The Silicon Lifecycle
Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were ...
Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. In this episode, Thomas Betts chats with ...
Manufacturers of test-and-measurement equipment have long recognized the need to allow for automated testing. So, they usually build equipment with some type of I/O interface. The General-Purpose ...
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