EDN

New test points slash ATPG test pattern count

Scan testing has been the foundation of digital-device production test for many years. Several innovations have been developed to keep up with the growth in pattern-set sizes brought about by large ...
Semiconductor Engineering

Better ATPG To Minimize Chip Test Time And Cost

As chips get ever bigger and more complex, the electronic design automation (EDA) industry must innovate constantly to keep up. Engineers expect every new generation of silicon to be modeled, ...
Semiconductor Engineering

Can Your ATPG Do This? Cut Defects Escaping Detection With ML

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...
Electronic Design

What’s The Difference Between Scan ATPG And IJTAG Pattern Retargeting?

Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...
EDN

Product How To: DFT strategy for ARM processor-based designs

One of the most significant design trends of the decade is the widespread use of ARM® multicore processors in systems-on-chip (SoCs). Designers’ ability to easily and cost-effectively employ multiple, ...