New research paper titled “Supervised Learning for Coverage-Directed Test Selection in Simulation-Based Verification” from researchers at University of Bristol and Infineon Technologies. “Constrained ...

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

With more than 20% of organizations deploying updates multiple times per day, according to my company's study, the complexity of test authoring has grown significantly. Test authoring is the process ...