Modular and open test architectures enable engineers to build the right solution for each challenge, whether integrating ...

When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...

Memory test at-speed isn�t easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to ...

As boring as propeller designs may seem to the average person, occasionally there’s a bit of a dust-up in the media about a ‘new’ design that promises at least a few percent improvement in performance ...