MUNICH, Germany — Negevtech Ltd., a wafer inspection company formed by former Orbot Instruments Ltd. executives, has started to record equipment sales for its Negevtech 302 wafer inspection machine, ...
TOKYO — During the Semicon Japan trade show here today, nLine Corp. rolled out its first product–a wafer inspection tool, based on a new and radical holographic imaging technology. The new ...
November 24, 2013. Rudolph Technologies has announced that it has won orders for its AWX FSI unpatterned wafer inspection system at both a major Southeast Asia-based outsourced assembly and test (OSAT ...
Advancements in structured illumination and computational imaging are revolutionizing semiconductor wafer inspection, ...
Unpatterned wafer inspection, which has flown well under the radar for most of the semiconductor industry, is becoming more critical amid the need to find defects earlier in the manufacturing process ...
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New Microtronic WaferWeight Precisely Monitors Semiconductor Wafer Mass During Macro Defect Inspection
Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as ...
Defect inspection scientists from Huazhong University of Science and Technology, Harbin Institute of Technology and The Chinese University of Hong Kong make a thorough review of new perspectives and ...
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