At Formnext 2025, BLT introduced the BLT-PrintInsight software platform to address significant challenges posed by defects ...

When a broken wheel caused a derailment on Norfolk Southern — just a mile after NS received the train through interchange — ...

Bump scaling is pushing defect inspection to the limit. What comes next and why it matters.

Scientists in China have developed a new deep learning model based on the so-called "You Only Look Once" algorithm, which requires only one forward propagation pass through the neural network to make ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Manufacturers are advancing AI-powered initiatives to gain efficiencies, especially around maintenance, quality and energy ...