EDN

Logic Vision and Advantest to Develop Tester Support

San Jose, CA – April 16, 2001 – Logic Vision, Inc., an IP provider of embedded test solutions, and Advantest, an automatic test equipment supplier and producer of electronic and optoelectronic ...
Semiconductor Engineering

Improve Logic Test With A Hybrid ATPG/BIST Solution

Two test strategies are used to test virtually all IC logic—automatic test pattern generation (ATPG) with test pattern compression, and logic built-in self-test (BIST). For many years, there was a ...
EDN

Agilent rolls out desktop memory, logic tester

PALO ALTO, Calif.–Agilent Technologies Inc. today rolled out a desktop version of its flash-memory and logic tester line. The Versatest Model V4000 is a complete, single platform that is geared for ...
Electronic Design

Combining Logic BIST and Scan Test Compression

Small geometries have projected IC technology into an era where test has become a crucial part in the chip design process and have introduced new challenges needing solutions that use already ...
Electronic Design

Logic ChipTester

Over time many of us accumulate a stock of components, including logic IC's (TTL and CMOS). If you're anything like me, many of these will be secondhand - salvaged from old projects and PCBs. The ...