When choosing an RF instrument, it is easy to get lost in the many specifications that vendors use to characterize an instrument’s performance. Moreover, in a world where wireless technologies are ...
Many noise sources can plague high-speed radio-frequency (RF) analog signal chains, making design considerations that much more challenging. Both megahertz and sub-terahertz sampling-rate converters ...
The 2006 International Test Conference is scheduled for the week of October 22 in Santa Clara, CA. For more on this year’s ITC, read our interview with program chair Anne Gattiker. Semiconductor test ...
Abstract— Today’s on-chip Analog/Mixed-Signal and RF (A/RF) systems have reached a limit of size and complexity where transistor-level SPICE and FastSPICE simulation approaches cannot deliver a ...
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