Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...

Test patterns play critical roles in physical layer compliance testing by challenging different aspects of a system. Receivers in HSS (high-speed serial) technology must be stable. When the average ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

ATPG (Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an EDA method/technology used to find an input or test sequence. When applied to a digital circuit, ATPG enables ...

It’s no secret that a successful yield ramp directly impacts integrated circuit (IC) product cost and time-to-market. Tools and techniques that help companies ramp to volume faster, while also ...