An atomic force microscope can reveal a range of subsurface information about a sample through mechanical excitation of both the sample and the tip. Imaging beneath the surface of a sample has always ...
Over the past few years, transmission electron microscopy (TEM) has been revolutionized, not only by the introduction of new hardware such as field-emission electron guns, aberration correctors and ...
Hebei Key Laboratory of Optic-Electronic Information and Materials, College of Physics Science and Technology, Hebei University, Baoding 071002, P. R. China ...
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